Anthony:
No, the tests are not in any ETSI TS. There is an open WI in SCP to create TTCN3 tests for the UICC but I was the only person that seemed to be interested in working on it which is why I proceeded on my own "out of band". The consensus in SCP was to develop their own homegrown testing language(s).
Cheers, Scott
Original Message
From: Anthony Wiles [This email address is being protected from spambots. You need JavaScript enabled to view it.]
Sent: Fri 4/2/2004 2:24 AM
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Cc:
Subject: Re: TTCN3 for Smart Cards and SIMs
Scott,
BTW are these tests standardised by ETSI or are they proprietary? I ask because I am trying to build a repository of all ETSI TTCN-3 test specs and was wondering if it would be possible to include your tests.
Regards,
Anthony
Original Message
From: Scott Guthery [This email address is being protected from spambots. You need JavaScript enabled to view it.]
Sent: 01 April 2004 14:08
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Subject: TTCN3 for Smart Cards and SIMs
Hello, Anthony ...
As a quick update, we are successfully using TTCN3 to test smart cards and SIMs. We have defined a smart card framework in TTCN3 that makes writing these tests quite easy.
The big win so far is being able to generate lots of "all possible" style tests that run through all values of various APDU parameters to make sure that the smart card does the right thing in all cases. Of course they take some time to run but that's what weekends are for, right?
Another win is being able to write tests of the card's cryptography that involve random numbers.
Hope all is well.
Cheers, Scott
